Example：10.1021/acsami.1c06204 or Chem. Rev., 2007, 107, 2411-2502
Short-range order and atomic diffusion in liquid Ge andSi20Ge80investigated by neutron scattering and x-ray diffraction Physical Review B (IF4.036), Pub Date : 2021-10-25, DOI: 10.1103/physrevb.104.134108 H. Weis, D. Holland-Moritz, F. Kargl, F. Yang, T. Unruh, T. C. Hansen, J. Bednarčik, A. Meyer
We studied structure and dynamics in liquid Ge and . Quasielastic neutron scattering (QNS) was employed to accurately determine the Ge self-diffusion coefficient. Static structure factors were measured using neutron and x-ray diffraction. Containerless processing via electromagnetic levitation (EML) enabled to obtain structure factors over a broad temperature range from the metastable regime of the undercooled melt to several hundred Kelvin above the melting point. Moreover, isotopic substitution and combination with x-ray diffraction allowed to determine the partial structure factors , and for liquid . The topological structures of liquid Ge and are very similar. In addition, the Ge self-diffusion coefficients in liquid Ge and are equal within error limits.